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KMID : 0381920060360020047
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Korean Journal of Microscopy
2006 Volume.36 No. 2 p.47 ~ p.56
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Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
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Kim Gyeung-Ho
Ahn Jae-Pyoung
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Abstract
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Improvements are made to existing primitive cell volume measurement method to provide a real-time analysis capability for the phase analysis of nanocrystalline materials. Simplification is introduced in the primitive cell volume calculation leading to fast and reliable method for nano-phase identification and is applied to the phase analysis of Mo-Si-N nanocoating layer. In addition, comparison is made between real-time and film measurements for their accuracy of calculated primitive cell volume values and factors governing the accuracy of the method are determined. About 5% accuracy in primitive cell determination is obtained from camera length calibration and this technique is used to investigate the cell volume variation in WC-TiC coreshell microstructure. In addition to chemical compositional variation in core-shell type structure, primitive cell volume variation reveals additional information on lattice coherency strain across the interface.
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KEYWORD
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Convergent beam electron diffraction, Nanophase materials, Primitive cell volume
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